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About
The image quality improvement and the decrease of the amount of radiation exposure are obtained by efficiently converting X-ray information into the image information.

Since the quantum noise of the X-ray is dominant as the image granularity of an X-ray image, use of a highly X-ray absorbent material as a phosphor is important to the improvement of the image granularity.
The cesium bromide (hereinafter referred to as "CsBr") has a high absorption coefficient in a wider X-ray energy area, and has excellent properties as a fluorescent material. Further, CsBr allows formation of a layer by vapor deposition. This is expected to ensure improvement of the fill factor -- another advantage of this technology.

Fig.1 Light guide effects of a pillar structure
In the conventional CR(Computed Radiography) plate using a granular type phosphor, the phosphor particles are dispersed on a resin binder, and layer formation is made by coating. When this plate produced by coating is used, light scattering occurs on the interface between the phosphor particles and resin, and image sharpness is reduced by the scattering of the scanning laser beam. Further, due to the light scattering inside the layer, a loss easily tends to occur to the photostimulable luminescence in response to the X-ray information captured by the lower layer of the plate, when detected by a light receiving section on the surface layer. By contrast, in the vapor deposition plate, the phosphor crystal is formed in the shape of a column. Thus, the intra-layer scattering of LD(Laser Diode) beam for scanning is reduced by the light guiding effect; further, this pillar-shaped structure ensures effective introduction of the photostimulable luminescence to the light receiving section. This arrangement is a very effective technological feature that improves the image quality of the CR plate (Fig. 1).

Fig.2 Sectional scanning electron micrograph view of CsBr phosphor

Fig. 3 Transmittance images of phosphor layer
In the layer formation of the phosphor, vapor deposition conditions as such as a degree of vacuum and substrate temperature are adjusted in such a way that a phosphor will be formed in a pillar-shaped crystal structure according to the vacuum vapor deposition. A heat-resistant 17 x 17-inch smooth substrate is installed in the large-sized chamber. While adjusting the vapor deposition conditions such as a degree of vacuum and substrate temperature, the vapor deposition material is heated whereby uniformity in the vapor-deposited area is achieved. The thickness of the phosphor layer is determined while adjusting the sharpness of the image performance and the granularity, in such a way that the layer thickness will be 1.5 times that of the coated plate formed of a granular phosphor.
To examine the crystal shape of the CsBr formed into a layer, the cross section of the phosphor layer was observed using a scanning electron microscope. It has been confirmed that the CsBr phosphor forms a pillar-shaped structure, as shown in Fig. 2.
Further, the phosphor layer was separated from the substrate and a spot light was applied from the back. Then it was examined from the front side. It has been revealed that a clearer image is provided by the vapor deposition plate than the coated plate (Fig. 3). This suggests a high degree of light guiding properties of the CsBr phosphor layer.
DQE is a characteristic value indicating the efficiency of converting the MTF(Modulation Transfer Function) and WS(Wiener Spectrum) to image performances with respect to a predetermined number of X-ray quantums. The greater this value, the smaller the S/N ratio of the output as compared to the signal-to-noise ratio of the input (hereinafter referred to as "S/N ratio"). In other words, the higher the DQE means the higher the S/N ratio of the output image, and this signifies an image of higher visibility. The DQE of the vapor deposition plate was calculated using the result of evaluating the image performances such as MTF and WS. The DQE is an evaluation value used as an index to express the image performance.
DQE(u) in the space frequency u can be expressed by the formula (1):
DQE(u) = {Y2 MTF2(u)/WS(u)}/q ... (1)
where q denotes the number of incoming X-ray photons, and V shows image contrast.
The DQE of the vapor deposition plate obtained from the formula (1) has been found out to be two or more times that of the coated plate.
The vapor deposition plate provides a substantial improvement in the image sharpness and granularity in conformity to the image performance. Excellent results have been recorded in the visibility of the shadow of the crest of the ribs of the pectoral region and the tissue of the lung field, as compared with that of the coated plate.